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AMOLF Institutional Repository

Selected Open Access and other scholarly publications from AMOLF and related researchers.

A parallel dectection system for a mass spectrometer Article

Int. J. Mass Spectrom. Ion Phys.

P.J.C.M. Nowak, H.H. Holsboer, W. Heubers, R.W. Wijnaendts van Resandt and J.H. Los

January 1980
Product state distributions for He+ + 02 charge transfer at high energy (100-300 eV) Article

Chem. Phys. Lett., 509-513.

K.T. Gillen and A.W. Kleyn

January 1980
Segregation effects in pulsed laser annealing of ion-implanted silicon In Proceedings

D. Hoonhout and F.W. Saris

January 1980
Characterization of ion-implanted and pulse-laser-annealed junctions; application to silicon solar cells In Proceedings

J. Michel, E. Fabre, I. Yamada, D. Hoonhout and F.W. Saris

January 1980
Experiments on electron capture and ionization by ions In Proceedings

F.J. de Heer

January 1980
Factor analysis of the influence of changes in experimental conditions in pyrolysis-mass spectrometry Article

J. Anal. Appl. Pyrolysis, 7-18.

W. Windig, P.G. Kistemaker and J.R. Haverkamp

January 1980
Time evolution of collision-induced hot spikes Article

Radiat. Eff., 43-48.

J.-B. Sanders

January 1980
Energy distributions of sputtered neutral particles by ion bombardment In Proceedings

A.E. de Vries

January 1980

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