AMOLF Institutional Repository
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Selective ion source for the analysis of air contaminants Article
Int. J. Mass Spectrom. Ion Phys., 277-280.January 1983 -
Thermal aspects of laser desorption mass spectrometry (LDMS) Article
Int. J. Mass Spectrom. Ion Phys., 11-14.G.J.Q. van der Peyl, K. Isa, J.R. Haverkamp and P.G. Kistemaker
January 1983 -
Kinetic energy distribution measurement of laser produced ions Article
Int. J. Mass Spectrom. Ion Phys., 7-10.G.J.Q. van der Peyl, W.J. van der Zande, K. Bederski, A.J.H. Boerboom and P.G. Kistemaker
January 1983 -
Very sensitive electro-optical simultaneous ion detection system Article
Int. J. Mass Spectrom. Ion Phys., 131-134.January 1983 -
Ion beam analysis of the reaction of Pd with Si(100) and Si(111) at room temperature Article
Surf. Sci., 1-25.R.M. Tromp, E.J. van Loenen, M. Iwami, R.G. Smeenk and F.W. Saris
January 1983 -
Enhancement of damage creation at metal-silicon interfaces during H+ and He+ irradiation Article
Physica B, 328-331.January 1983 -
Fotoionisatie-massaspektrometer meet verontreinigingen in lucht Article
Chem. Mag.January 1983 -
Magnetic field paralleliser for 2p electron-spectrometer and electron-image magnifier Article
J. Phys. E, 313-324.January 1983