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AMOLF Institutional Repository

Selected Open Access and other scholarly publications from AMOLF and related researchers.

Semi-quantal differential spectra for the process Cs + 02(u=0) Article

Chem. Phys. Lett., 448-451.

M.R. Spalburg and J.H. Los

January 1985
High resolution studies of NiSi2 ultrathin film formation by ion scattering and cross-section tem Article

Surf. Sci., 52-69.

E.J. van Loenen, A.E.M.J. Fischer, J.F. van der Veen and F.K. LeGoues

January 1985
Epitaxial growth of Si on GaP(100) and Si(111), monitored by soft X-ray reflection Article

Surf. Sci., 601-613.

M.P. Bruijn, H.G. Muller, J. Verhoeven (Jan) and M.J. van der Wiel

January 1985
Total cross sections for electron scattering from Ar, Kr and Xe Article

J. Phys. B, 2021-2036.

R.W. Wagenaar and F.J. de Heer

January 1985
Hoe herkent men een goed instituut? Book Chapter

J. Kistemaker

January 1985
Ion-assisted etching of silicon by SF6 Article

Appl. Phys. Lett., 1166-1168.

D.J. Oostra, R.A. Haring, A.E. de Vries, F.H.M. Sanders and K. Miyake

January 1985
Ti-Si mixing at room temperature: a high resolution ion backscattering study Article

Surf. Sci., 65-78.

E.J. van Loenen, A.E.M.J. Fischer and J.F. van der Veen

January 1985
Ion channeling and blocking study of ultra-thin NiSi2 films grown on atomically clean Si(111) surfaces In Proceedings

E.J. van Loenen and J.F. van der Veen

January 1985

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