AMOLF Institutional Repository
Selected Open Access and other scholarly publications from AMOLF and related researchers.
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Solid-phase epitaxial regrowth of fine-grain polycrystalline silicon Article
J. Mater. Res., 155-161.January 1986 -
Ion scattering determination of the atomic arrangement at polished diamond(111) surfaces before and after reconstruction Article
Surf. Sci., 502-518.January 1986 -
High-resolution Rutherford backscattering spectrometry or metal-silicon interfaces Article
Surf. Sci., 701-712.January 1986 -
January 1986
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Electron irradiation-activated low-temperature annealing of phosphorus-implanted silicon Article
Appl. Phys. Lett., 1132-1134.M. Miyao, A. Polman (Albert), W.C. Sinke (Wim), F.W. Saris and R. van Kemp
January 1986 -
Direct observation of resolidification from the surface upon pulsed-laser melting of amorphous silicon Article
Appl. Phys. Lett., 1252-1254.J.J.P. Bruines, R.P.M. van Hal, H.M.J. Boots, W.C. Sinke (Wim) and F.W. Saris
January 1986 -
January 1986
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January 1986