AMOLF Institutional Repository
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Energy distributions of sputtered molecules and clusters In Proceedings
January 1986 -
Time-resolved x-ray absorption of an amorphous Si foil during pulsed laser irradiation In Proceedings
K. Murakami, H.C. Gerritsen, H. van Brug, F. Bijkerk, F.W. Saris and M.J. van der Wiel
January 1986 -
A new ion detection system with uniform mass distribution and flat image plane Article
Int. J. Mass Spectrom. Ion Processes, 29-36.January 1986 -
A low-voltage ion desorption source for high molecular weight ions Article
Int. J. Mass Spectrom. Ion Processes, 59-73.January 1986 -
Experiments on "above-threshold ionization" of atomic hydrogen Article
Phys. Rev. A, 236-243.H.G. Muller, H.B. van Linden van den Heuvell and M.J. van der Wiel
January 1986 -
Anomalous time-of-flight distributions observed for argon implanted in silicon and resputtered by Ar+-ion bombardment Article
Phys. Rev. Lett., 739-741.G.N.A. van Veen, F.H.M. Sanders, J. Dieleman, A. van Veen, D.J. Oostra and A.E. de Vries
January 1986 -
A UHV system for simultaneous evaporation and ion beam mixing and in situ RBS analysis Article
Nucl. Instrum. Methods Phys. Res. B, 66-72.J.F.M. Westendorp, P.K. Rol, S. Doorn, H.H. Kersten, J. ter Beek, J. Derks, F.W. Saris, R. Koudijs and W.J. van Kilsdonk
January 1986 -
Rotational, vibrational and translational energy distributions of sputtered S2 molecules Article
Europhys. Lett., 449-453.R. de Jonge, T.S. Baller, M.G. Tenner, A.E. de Vries and K.J. Snowdon
January 1986