AMOLF Institutional Repository
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Reflection extended x-ray absorption fine-structure measurement on Ni/C and NixSiy/C multilayered reflection coatings Article
J. Vac. Sci. Technol. A, 2182-2187.H. van Brug, M.J. van der Wiel, R. van der Pol, J. Verhoeven (Jan), G. van der Laan and J.B. Goedkoop
January 1988 -
A pyrolysis-mass spectrometry investigation of pectin methylation Article
Anal. Chem., 1498-1502.R.E. Aries, C.S. Gutteridge, W.A. Laurie, J.J. Boon and G.B. Eijkel (Gert)
January 1988 -
Dichotomy of the hydrogen atom in superintense, high-frequency laser fields Article
Phys. Rev. Lett., 939-942.January 1988 -
Decay of the C2S+ quasibound states of HeH: an experimental and theoretical study Article
Chem. Phys. Lett., 14-19.January 1988 -
Summary abstract: structure characterization of silicide-silicon interfaces Article
J. Vac. Sci. Technol. A, 2094-2095.January 1988 -
Mechanisms of sputtering of Si in a Cl2 environment by ions with energies down to 75 eV Article
J. Appl. Phys., 315-322.January 1988 -
Structure determination of the Ge(111)-c(2x8) surface by medium-energy ion scattering Article
Phys. Rev. B, 1585-1588.P.M.J. Marée, K. Nakagawa, J.F. van der Veen and R.M. Tromp
January 1988 -
Observation of steric effects in gas-surface scattering Article
Nature, 420-422.January 1988