AMOLF Institutional Repository
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Stability of amorphous Ir-Ta diffusion barriers between Cu and Si Article
Mater. Lett., 500-503.R. de Reus, R.J.I.M. Koper, H. Zeijlemaker (Hans) and F.W. Saris
January 1990
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The crystallization temperature of amorphous transition-metal alloys Article
Mater. Lett., 487-493.R. de Reus and F.W. Saris
January 1990
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Monte Carlo simulation of two-dimensional hard ellipses Article
Phys. Rev. A, 2126-2136.January 1990 -
Multiple-scattering effects for the propagation of light in 3D slabs Article
J. Phys.: Condens. MatterJanuary 1990 -
Stability of Ir-Ta diffusion barriers Article
Mater. Sci. Eng. B, 127-134.January 1990
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Structural and electrical characterization of Si(100) implanted with P+ and Si+ ions along the [100] channelling direction Article
Mater. Sci. Eng. B, 149-165.R. Schreutelkamp, R. de Reus, F.W. Saris, R.E. Kaim, J.F.M. Westendorp, K.T.F. Janssen and J.J.M. Ottenheim
January 1990
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Buffer layers for superconducting Y-Ba-Cu-O thin films on silicon and SiO2 Article
Mater. Sci. Eng. B, 135-147.R. de Reus, F.W. Saris, G.J. van der Kolk, C. Witmer, B. Dam (Bernard), D.H.A. Blank, D.J. Adelerhof and J. Flokstra
January 1990
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Defect states of amorphous Si probed by the diffusion and solubility of Cu Article
Appl. Phys. Lett., 1230-1232.A. Polman (Albert), D.C. Jacobson, S. Coffa, J.M. Poate, S. Roorda and W.C. Sinke (Wim)
January 1990