AMOLF Institutional Repository
Selected Open Access and other scholarly publications from AMOLF and related researchers.
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Thermal roughening studied by scanning tunneling microscopy Article
J. Vac. Sci. Technol. A, 293-296.January 1990 -
Minority-carrier transport in non-uniformly doped silicon - an analytical approach Article
IEEE Trans. Electron Devices, 210-221.January 1990 -
Ultrafast relaxation of electrons probed by surface plasmons at a thin silver film Article
Phys. Rev. Lett., 784-787.January 1990 -
Long-time decay of velocity autocorrelation function of two-dimensional lattice gas cellular automata In Proceedings
January 1990 -
Segregation at the clean and oxidized Pt0.5Ni0.5(111) surface studied by medium-energy ion scattering Article
Nucl. Instrum. Methods Phys. Res. BS. Deckers, F.H.P.M. Habraken, W.F. van der Weg, A.W. Denier van der Gon, B. Pluis and J.F. van der Veen
January 1990 -
Peak shape analysis for the determination of interface structure in reactive metallic bilayers: Pd on Al Article
Nucl. Instrum. Methods Phys. Res. B, 429-433.January 1990 -
January 1990
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Monte carlo simulations Book Chapter
January 1990