AMOLF Institutional Repository
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Reduction of secondary defect formation in MeV As ion implanted Si(100) Article
Nucl. Instrum. Methods Phys. Res. B, 614-618.R. Schreutelkamp, W.X. Lu, J.R. Liefting, V. Raineri, J.S. Custer and F.W. Saris
January 1991 -
Order-disorder transitions at surfaces Article
Surf. Sci., 1-5.January 1991 -
Laser single photon ionization mass spectrometry of linear, branched and cyclic hexanes Article
Int. J. Mass Spectrom. Ion Processes, 475-489.R.J.J.M. Steenvoorden, P.G. Kistemaker, A.E. de Vries, L. Michalak and N.M.M. Nibbering
January 1991 -
Photon localization in disorder-induced periodic multilayers Article
J. Phys. I, 1145-1154.January 1991 -
Characterisation of kerogens, coals and asphaltenes by quantitative pyrolysis-mass spectrometry Article
J. Anal. Appl. Pyrolysis, 25-45.January 1991 -
Enhanced preferential sputtering of a hydrogenated barium surface Article
Appl. Phys. Lett., 158-160.January 1991 -
Isotope effect in dissociative adsorption of O2 on Ag(111) Article
Surf. Sci., 24-32.January 1991 -
The temperature distribution in a gas core fission reactor Article
Ann. Nucl. Energy, 183-195.J.E. Hoogenboom, H. van Dam, J.C. Kuijper, J. Kistemaker, W. Boersma-Klein and F. Vitalis
January 1991