AMOLF Institutional Repository
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Design and performance of a focused beam line for surface x-ray diffraction Article
Rev. Sci. Instrum., 1083-1086.C. Norris, M.S. Finney, G.F. Clark, G. Baker, P.R. Moore and R. van Silfhout
January 1992 -
Microscopic aspects of the nematic phases In Proceedings
January 1992 -
Design of a 4 AMP D- 2 AMP D Tech Report
R. Hemsworth, J. Pam, L. Doceul, C. Deck, A.J.T. Holmes and H.J. Hopman
January 1992 -
Time-dependent diffusivity of Au in amorphous Pd40Ni40P20 measured by Rutherford-backscattering spectrometry Article
Nucl. Instrum. Methods Phys. Res. B, 445-450.P.A. Duine, J. Sietsma, A. van den Beukel and A.J. Vredenberg
January 1992 -
Structural and electrical defects in amorphous silicon probed by positrons and electrons Article
J. Appl. Phys., 5145-5152.S. Roorda, R.A. Hakvoort, A. van Veen, P.A. Stolk and F.W. Saris
January 1992 -
Huygens/ACP: An instrument for aerosols chemical composition measurements. In Proceedings
G. Israel, E. Chassefi, H.B. Niemann, J.J. Boon, F. Raulin, M. Cabane and C. Sabl
January 1992 -
January 1992
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State-selective electron capture and core excitation in slow Ne6+-He collisions Article
J. Phys. B, 4851-4864.J.P.M. Beijers, R. Hoekstra (Ronnie), R. Morgenstern and F.J. de Heer
January 1992