AMOLF Institutional Repository
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Enhanced reflectivity of soft x-ray multilayer mirrors by reduction of Si atomic density Article
Appl. Phys. Lett., 3297-3299.R. Schlatmann, A. Keppel, Y. Xue, J. Verhoeven (Jan) and M.J. van der Wiel
January 1993 -
Ion irradiation damage in Er-doped silica probed by the Er3+ luminescence lifetime at 1.535 mm Article
J. Appl. Phys., 1669-1674.January 1993 -
January 1993
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January 1993
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Array detection of mass spectra In Proceedings
January 1993 -
January 1993
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Very low surface recombination velocities on 2.5 Wcm Si wafers, obtained with low-temperature PECVD of Si-oxide and Si-nitride In Proceedings
C. Leguijt, J.A. Eikelboom, P.H. Amesz, R.A. Steeman, W.C. Sinke (Wim), P.M. Sarro, L.A. Verhoef, P.-P. Michiels, Z.H. Chen and A. Rohatgi
January 1993 -
Indications of high-intensity adiabatic stabilization in neon Article
Phys. Rev. Lett., 3263-3266.M.P. de Boer, J.H. Hoogenraad, R.B. Vrijen, L.D. Noordam and H.G. Muller
January 1993