AMOLF Institutional Repository
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Importance of the additional step-edge barrier in determining film morphology during epitaxial growth Article
Phys. Rev. B, 14790-14793.J.A. Meyer, J. Vrijmoeth, H.A. van der Vegt, E. Vlieg (Elias) and R.J. Behm
January 1995 -
Linking of pyrolysis-chemical ionisation mass spectrometric and monomer compositional data of O-(2-hydroxyethyl) celluloses by canonical correlation analysis Article
J. Anal. Appl. Pyrolysis, 21-38.January 1995 -
Thermal diffuse scattering from surface-melted Pb(110) Article
Phys. Rev. B, 14753-14755.H.M. van Pinxteren, S. Chandavarkar, W.J. Huisman, J.M. Gay and E. Vlieg (Elias)
January 1995 -
Non-Boltzmann behavior from the Boltzmann equation Article
Phys. Rev. E, 4287-4291.January 1995 -
Optical gain in erbium-implanted Al2O3 waveguides In Proceedings
G.N. van den Hoven, E. Snoeks, A. Polman (Albert), C. van Dam, J.W.M. van Uffelen and M.K. Smit
January 1995 -
Atomic-detail simulation studies of smectic liquid crystals Article
Mol. Simul., 343-360.January 1995 -
Correlation of size and photoluminescence for Ge nanocrystals in SiO2 matrices In Proceedings
C.M. Yang, K.V. Shcheglov, M.L. Brongersma (Mark), A. Polman (Albert) and H.A. Atwater (Harry)
January 1995 -
Measuring and modifying the spontaneous emission rate of erbium near an interface Article
Phys. Rev. Lett., 74(13), 2459-2462.January 1995