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AMOLF Institutional Repository

Selected Open Access and other scholarly publications from AMOLF and related researchers.

Microscale characterization of algal and related particulate organic matter by direct temperature-resolved mass spectrometry Article

Mar. Chem., 27-54.

T.I. Eglinton, J.J. Boon, E.C. Minor and R.J. Olson

January 1996
Luminescence Quenching in Erbium-Doped Hydrogenated Amorphous Silicon In Proceedings

A. Polman (Albert), A. Polman (Albert), J.H. Shin, G.N. van den Hoven, W.G.J.H.M. van Sark, A.J. Vredenberg, S. Lombardo (Salvatore) and S.U. Campisano

January 1996
Rapid microscale analyses with an external ion source Fourier transform ion cyclotron resonance mass spectrometer Article

Int. J. Mass Spectrom. Ion Processes, 391-403.

R.M.A. Heeren (Ron) and J.J. Boon

January 1996
Hydrogen solubility and network stability in amorphous silicon Article

Phys. Rev. B, 4415-4427.

S. Acco, D.L. Williamson, P.A. Stolk, F.W. Saris, M.J. van den Boogaard, W.C. Sinke (Wim), W.F. van der Weg, S. Roorda and P.C. Zalm

January 1996
Growth mode and interface structure of Ag on the HF-treated Si(111): H surface Article

Surf. Sci., 229-238.

A. Nishiyama, G. ter Horst, P.M. Zagwijn, G.N. van den Hoven, J.W.M. Frenken, F. Garten, A.R. Schlatmann and J. Vrijmoeth

January 1996
Orientation and energy dependence of NO scattering from Pt(111) Article

J. Chem. Phys., 8301-8311.

R.J.W.E. Lahaye, S. Stolte, S. Holloway and A.W. Kleyn

January 1996
Two-electron atoms in superintense radiation fields: Dichotomy and stabilization Article

Phys. Rev. A, 3431-3443.

M. Gavrila (Mihai) and J. Shertzer

January 1996
Irradiation effects in a-SiC studied via RBS-C, Raman-scattering and surface profiling Article

Nucl. Instrum. Methods Phys. Res. B, 748-752.

J. Conrad, Thomas Weber and W. Bolse

January 1996

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