AMOLF Institutional Repository
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Exciton-erbium interactions in Si nanocrystal-doped SiO2 Article
J. Appl. Phys., 1992-1998.January 2000 -
January 2000
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Origin of MeV ion irradiation-induced stress changes in SiO2 Article
J. Appl. Phys., 59-64.M.L. Brongersma (Mark), E. Snoeks, T. van Dillen and A. Polman (Albert)
January 2000 -
Strong exciton-erbium coupling in Si nanocrystal-doped SiO2 Article
Appl. Phys. Lett., 2325-2327.January 2000 -
Observation of a bottleneck in the vibrational relaxation of liquid bromoform Article
Chem. Phys., 157-164.January 2000 -
A new DOAS parameterization for retrieval of trace gases with highly-structured absorption spectra Article
Geophys. Res. Lett., 4069-4072.January 2000 -
Jovian x-ray emission from solar x-ray scattering Article
Geophys. Res. Lett., 1339-1342.A.N. Maurellis, T.E. Cravens, G.R. Gladstone, J.H. Waite and L.W. Acton
January 2000 -
Recombination of simple molecular ions studied in storage ring: dissociative recombination of H2O+ Article
Faraday Discuss., 295-302.S. Rosén, A.M. Derkatch, J. Semaniak, A. Neau, A. Al Khalili, A. Le Padellec, L. Vikor, R.D. Thomas, H. Danared, M. Ugglas, et al. M. Larsson
January 2000