AMOLF Institutional Repository
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Structure of freely suspended chiral smectic films as determined by x-ray reflectivity and optical ellipsometry Article
Phys. Rev. E, 64(Article number: 21702), 1-8.A. Fera, R. Opitz, W.H. de Jeu, B.I. Ostrovskii, D. Schlauf and C. Bahr
January 2001 -
Pyrolysis mass spectral characterization of wood from cad-deficient pine Article
J. Wood Chem. Technol., 19-29.January 2001 -
January 2001
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Optical probes inside photonic crystals Article
MRS Bulletin, 642-646.January 2001 -
Femtosecond mid-infrared spectroscopy of aqueous solvation shells Article
J. Chem. Phys., 8942-8948.January 2001 -
January 2001
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Effects of heat treatment and concentration on the luminescence properties of erbium-doped silica sol-gel films Article
J. Non-Cryst. Solids, 158-164.L.H. Slooff, M.J.A. de Dood (Michiel), A. van Blaaderen and A. Polman (Albert)
January 2001 -
Atomic streak camera operating in the extreme ultraviolet Article
Rev. Sci. Instrum., 3205-3207.J.B.M. Warntjes, A. Gürtler, A. Osterwalder, F. Rosca-Pruna, M.J.J. Vrakking and L.D. Noordam
January 2001