AMOLF Institutional Repository
-
C60+ secondary ion microscopy using a delay line detector Article
Anal. Chem., 82(3), 801-807.L.A. Klerk, N. P. Lockyer, A.V. Kharchenko, L. MacAleese (Luke), P.Y.W. Dankers (Patricia), J.C. Vickerman and R.M.A. Heeren (Ron)
February 2010 -
Modified reflection in birefringent layers of core-shell semiconductor nanowires Article
Semicond. Sci. Technol., 25(2, Article number: 24008), 1-5.February 2010 -
February 2010
-
Ultrafast surface vibrational dynamics Article
Surf. Sci. Rep., 65(2), 45-66.February 2010 -
Spatio-temporal correlations can drastically change the response of a MAPK pathway Article
PNAS, 107(6), 2473-2478.K. Takahashi (Koichi), S. Tanase-Nicola and P.R. ten Wolde (Pieter Rein)
February 2010
-
February 2010
-
On-the-fly targeted selection of labeled peptides in liquid chromatography/mass spectrometry based quantitative proteomics Article
Rapid Commun. Mass Spectrom., 24(2), 239-241.I.M. Taban Barbu, D.F. Smith (Donald), B. van Breukelen, Y.E.M. van der Burgt, M.C. Duursma, A.J.R. Heck (Albert), R.M.A. Heeren (Ron) and J. Krijgsveld
February 2010 -
Light passing through subwavelength apertures Article
Rev. Mod. Phys., 82(1), 729-787.F.J. Garcia-Vidal (Francisco), L. Martin-Moreno, T.W. Ebbesen and L.K. Kuipers (Kobus)
March 2010