AMOLF Institutional Repository
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Crystalline and electrical characteristics of silicon films deposited by ionized-cluster-beams Article
Jpn. J. Appl. Phys., 181-184.I. Yamada, F.W. Saris, T. Takagi, K. Matsubara, H. Takaoka and S. Ishiyama
January 1980 -
Residual damage to an atomically cleaned low-temperature-annealed Si (100) surface Article
Appl. Phys. Lett., 563-565.I. Yamada, D. Marton and F.W. Saris
January 1980 -
Limitations on mass separation by the weakly ionized plasma centrifuge Article
Z. Naturforsch. Teil A, 883-893.January 1980 -
A new charge exchange contribution to K-vacancy production Article
J. Phys. B, 2965-2973.January 1980 -
Total cross sections for electron scattering by molecular hydrogen Article
J. Phys. B, 3481-3491.January 1980 -
Highlights of twenty-five years atomic and molecular collisions physics: opening lecture given at the XI-th ICPEAC, Kyoto, Japan In Proceedings
January 1980 -
Curve crossing and repulsive potentials probed by laser induced half collsions: ICI and IBr Article
Chem. Phys., 159-168.M.S. de Vries, N.J.A. van Veen, M. Hutchinson and A.E. de Vries
January 1980 -
Total cross sections for electron scattering from Ne, Ar, Kr and Xe. Article
J. Phys. B, 3855-3866.January 1980