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AMOLF Institutional Repository

Selected Open Access and other scholarly publications from AMOLF and related researchers.

Total cross sections for electron scattering from Ar, Kr and Xe Article

J. Phys. B, 2021-2036.

R.W. Wagenaar and F.J. de Heer

January 1985
Hoe herkent men een goed instituut? Book Chapter

J. Kistemaker

January 1985
Ion-assisted etching of silicon by SF6 Article

Appl. Phys. Lett., 1166-1168.

D.J. Oostra, R.A. Haring, A.E. de Vries, F.H.M. Sanders and K. Miyake

January 1985
Ti-Si mixing at room temperature: a high resolution ion backscattering study Article

Surf. Sci., 65-78.

E.J. van Loenen, A.E.M.J. Fischer and J.F. van der Veen

January 1985
Ion channeling and blocking study of ultra-thin NiSi2 films grown on atomically clean Si(111) surfaces In Proceedings

E.J. van Loenen and J.F. van der Veen

January 1985
Surface characterization of arsenic implanted silicon (100): a new insight into the inhibition of aluminium/silicon interdiffusion In Proceedings

N. Herbots, D. Gloesener, E.J. van Loenen and A.E.M.J. Fischer

January 1985
Pre-annealing of TiN barriers in A1 metallization of silicon In Proceedings

W.C. Sinke (Wim), P.K. Stout and F.W. Saris

January 1985
Ion beam crystallography of silicon surfaces III: Si(111)-(7x7) Article

Surf. Sci., 441-479.

R.M. Tromp and E.J. van Loenen

January 1985

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