AMOLF Institutional Repository
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Ion beam crystallography of surfaces and interfaces Article
Surf. Sci. Rep., 199-288.January 1985 -
Electron and ion beam activated solid phase epitaxy of ion-implanted silicon In Proceedings
M. Miyao, A. Polman (Albert), R. van Kemp, J.F.M. Westendorp, W.C. Sinke (Wim), J.F. van der Veen and F.W. Saris
January 1985 -
Solid-phase epitaxial regrowth of fine-grain polycrystalline silicon In Proceedings
W.C. Sinke (Wim), F.W. Saris, B.M. Ullrich, J.C. Barbour and J.W. Mayer
January 1985 -
The use of a pulsed laser for shallow-junction processing In Proceedings
W.C. Sinke (Wim), A. Polman (Albert), W.G.J.H.M. van Sark and F.W. Saris
January 1985 -
January 1985
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Stability of amorphous Cu/Ta and Cu/W alloys Article
J. Appl. Phys., 3052-3057.January 1985 -
Reaction of amourphous and crystalline alloys with silicon In Proceedings
January 1985 -
E-beam evaporated multilayer soft X-ray coatings, analyzed with CuKa radiation In Proceedings
M.P. Bruijn, S. Chakraborty, H.W. van Essen, J. Verhoeven (Jan) and M.J. van der Wiel
January 1985