AMOLF Institutional Repository
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Electron irradiation-activated low-temperature annealing of phosphorus-implanted silicon Article
Appl. Phys. Lett., 1132-1134.M. Miyao, A. Polman (Albert), W.C. Sinke (Wim), F.W. Saris and R. van Kemp
January 1986 -
Direct observation of resolidification from the surface upon pulsed-laser melting of amorphous silicon Article
Appl. Phys. Lett., 1252-1254.J.J.P. Bruines, R.P.M. van Hal, H.M.J. Boots, W.C. Sinke (Wim) and F.W. Saris
January 1986 -
January 1986
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January 1986
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State-resolved single electron capture in slow collisions of multi-charged ions with one- and two-electron atoms In Proceedings
January 1986 -
A continuous-flow helium cryostat and sample holder with unrestricted manipulation for ionscattering experiments in uhv Article
Vacuum, 259-262.January 1986 -
Stability of thin film amorphous metal alloys In Proceedings
January 1986 -
Automatic electron-beam deposition of multilayer soft x-ray coatings with laterally graded d-spacing Article
Opt. Eng., 916-921.M.P. Bruijn, S. Chakraborty, H.W. van Essen, J. Verhoeven (Jan) and M.J. van der Wiel
January 1986