AMOLF Institutional Repository
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A new ion detection system with uniform mass distribution and flat image plane Article
Int. J. Mass Spectrom. Ion Processes, 29-36.January 1986 -
A low-voltage ion desorption source for high molecular weight ions Article
Int. J. Mass Spectrom. Ion Processes, 59-73.January 1986 -
Experiments on "above-threshold ionization" of atomic hydrogen Article
Phys. Rev. A, 236-243.H.G. Muller, H.B. van Linden van den Heuvell and M.J. van der Wiel
January 1986 -
Anomalous time-of-flight distributions observed for argon implanted in silicon and resputtered by Ar+-ion bombardment Article
Phys. Rev. Lett., 739-741.G.N.A. van Veen, F.H.M. Sanders, J. Dieleman, A. van Veen, D.J. Oostra and A.E. de Vries
January 1986 -
A UHV system for simultaneous evaporation and ion beam mixing and in situ RBS analysis Article
Nucl. Instrum. Methods Phys. Res. B, 66-72.J.F.M. Westendorp, P.K. Rol, S. Doorn, H.H. Kersten, J. ter Beek, J. Derks, F.W. Saris, R. Koudijs and W.J. van Kilsdonk
January 1986 -
Rotational, vibrational and translational energy distributions of sputtered S2 molecules Article
Europhys. Lett., 449-453.R. de Jonge, T.S. Baller, M.G. Tenner, A.E. de Vries and K.J. Snowdon
January 1986 -
The anomalous behaviour of the ESID O+ yield from a Ni(110) surface during oxygen adsorption Article
Surf. Sci., 325-335.January 1986 -
Internal energy distribution of sputtered surfur molecules Article
Nucl. Instrum. Methods Phys. Res. B, 213-226.R. de Jonge, T.S. Baller, M.G. Tenner, A.E. de Vries and K.J. Snowdon
January 1986