AMOLF Institutional Repository
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Photoelectron spectroscopy on resonantly enhanced multiphoton dissociative ionization of hydrogen molecules Article
Chem. Phys. Lett., 43-48.J.H.M. Bonnie, J.W.J. Verschuur, H.J. Hopman and H.B. van Linden van den Heuvell
January 1986 -
A time-resolved x-ray absorption study of amorphous Si during pulsed laser irradiation Article
J. Appl. Phys., 1774-1783.H.C. Gerritsen, H. van Brug, F. Bijkerk, K. Murakami and M.J. van der Wiel
January 1986 -
Nieuwe fysische processen voor silicium zonnecellen Article
Energiespectrum, 190-202.January 1986 -
Theory and simulation of high-energy ion scattering experiments for structure analysis of surfaces and interfaces Article
Nucl. Instrum. Methods Phys. Res. B, 334-343.January 1986 -
Dissociative charge exchange of HeH+: an experimental study of the HeH molecule Article
Phys. Rev. Lett., 1219-1222.January 1986 -
Absolute differential cross sections for elastic scattering of electrons over small angles form noble-gas atoms Article
J. Phys. B, 3121-3143.R.W. Wagenaar, A. de Boer, T. van Tubergen, J.H. Los and F.J. de Heer
January 1986 -
Molecuulbundel-epitaxie van silicium op GaP en GaAs Article
Philips Tech. Tijdschr., 166-178.January 1986 -
Characterization of ultrathin nickel layers on Si(111) using RHEED and RBS Article
Appl. Surf. Sci., 143-150.January 1986