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AMOLF Institutional Repository

Selected Open Access and other scholarly publications from AMOLF and related researchers.

Transient processes at the Si-water interface during pulsed laser irradiation In Proceedings

A. Polman (Albert), W.C. Sinke (Wim), M.J. Uttormark and M.O. Thompson

January 1988
Ion-scattering analysis of semiconductor films In Proceedings

P.M.J. Marée and J.F. van der Veen

January 1988
Het harpoeneffect: wisselwerkingen aan oppervlakken Article

Natuur Techn., 450-461.

T.C.M. Horn, P.J. van den Hoek and A.W. Kleyn

January 1988
Electrical short-circuit current decay: practical utility and variations of the method Article

J. Appl. Phys., 5563-5570.

A. Zondervan, L.A. Verhoef, F.A. Lindholm and A. Neugroschel

January 1988
The internal energy of sputtered glycerol molecules, determined by photoionization mass spectrometry Article

J. Chem. Phys., 5314-5322.

R. Hoogerbrugge, M. Bobeldijk, P.G. Kistemaker and J.H. Los

January 1988
Low effective back-surface recombination velocity by boron implantation on 0.3-W-r-type silicon solar cells Article

J. Appl. Phys., 4683-4687.

L.A. Verhoef, A. Zondervan, F.A. Lindholm, M.B. Spitzer and C.J. Keavney

January 1988
MSi2/Si(111) (M=Co,Ni) interface chemical bond Article

Phys. Rev. Lett., 1743-1746.

P.J. van den Hoek, W. Ravenek and E.J. Baerends

January 1988
Modified Coulomb scattering in intense, high-frequency laser fields Article

Phys. Rev. A, 4536-4539.

J. van de Ree, J.Z. Kaminski and M. Gavrila (Mihai)

January 1988

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