AMOLF Institutional Repository
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Above-treshold ionization observed in the femtosecond regime In Proceedings
H.B. van Linden van den Heuvell, H.G. Muller, Pierre Agostini, G. Petite, A. Antonetti, M. Franco and A. Migus
January 1988 -
Structuuronderzoek van oppervlakken met röntgenstraling Article
Ned. Tijdschr. Natuurkd. A, 110-113.January 1988 -
Ion scattering as a probe of intermediate states in adsorption and reaction at surfaces Article
Surf. Sci., 793-797.S. Schubert, U. Imke, W. Heiland, K.J. Snowdon, P.H.F. Reijnen and A.W. Kleyn
January 1988 -
Asymmetries in dislocation densities, surface morphology, and strain of GaInAs/GaAs single heterolayers Article
J. Appl. Phys., 4843-4852.K.L. Kavanagh, M.A. Capano, L.W. Hobbs, J.C. Barbour, P.M.J. Marée, W. Schaff, J.W. Mayer, D. Pettit, J.M. Woodall, J.A. Stroscio, et al. R.M. Feenstra
January 1988 -
Light scattering in strongly scattering media: Multiple scattering and weak localization Article
Phys. Rev. B, 3575-3592.January 1988 -
Negative ion formation at a barium surface exposed to an intense positive-hydrogen ion beam Article
J. Appl. Phys., 3863-3873.January 1988 -
Growth of uniform epitaxial CoSi2 films on Si (111) Article
J. Appl. Phys., 3005-3013.A.E.M.J. Fischer, W.F.J. Slijkerman, K. Nakagawa, R.J. Smith, J.F. van der Veen and C.W.T. Bulle-Lieuwma
January 1988 -
Surface melting Book Chapter
January 1988