AMOLF Institutional Repository
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A computer program for the analytical calculation of potential and electric field in ion slit lens systems Article
Int. J. Mass Spectrom. Ion Processes, 283-301.January 1989 -
H- formation via surface conversion at a barium converter in a high power DC environment In Proceedings
C.F.A. van Os, C. Leguijt, R.M.A. Heeren (Ron), J.H. Los and A.W. Kleyn
January 1989 -
Invited lecture: Columnar ordering as an excluded-volume effect Article
Liq. Cryst., 929-940.January 1989 -
The influence of ion impact on the crystallization of amorphous PdTa films In Proceedings
J.P.W.B. Duchateau, H.C. Tissink, G.J. van der Kolk, J. Verhoeven (Jan) and F.W. Saris
January 1989 -
Evaluation of a tobacco fractionation procedure using pyrolysis mass spectrometry combined with multivariate analysis Article
Beitr. Tabakforsch. Internat., 261-282.M.A. Scheijen, B. Brandt-de Boer, J.J. Boon, W. Hass and V. Heemann
January 1989 -
Nickel and cobalt silicides on silicon: thin-film reaction and interface structure Article
Appl. Surf. Sci., 13-26.January 1989 -
Excimer laser induced deposition of tungsten on silicon Article
Appl. Surf. Sci., 386-396.A.J.P. van Maaren, R.L. Krans, E. de Haas and W.C. Sinke (Wim)
January 1989 -
Formation and characterization of multilayer coatings for X-ray optics Article
Vacuum, 711-716.January 1989