AMOLF Institutional Repository
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A broad band multilayer coated blazed grating for X-ray wavelengths below 0.6 nm In Proceedings
A.J.F. den Boggende, M.P. Bruijn, J. Verhoeven (Jan), H. Zeijlemaker (Hans), E.J. Puik and H.A. Padmore
January 1990 -
Computer simulations in statistical physics In Proceedings
January 1990 -
Multiple-scattering effects for the propagation of light in 3D slabs Article
J. Phys.: Condens. MatterJanuary 1990 -
Stability of Ir-Ta diffusion barriers Article
Mater. Sci. Eng. B, 127-134.January 1990
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Structural and electrical characterization of Si(100) implanted with P+ and Si+ ions along the [100] channelling direction Article
Mater. Sci. Eng. B, 149-165.R. Schreutelkamp, R. de Reus, F.W. Saris, R.E. Kaim, J.F.M. Westendorp, K.T.F. Janssen and J.J.M. Ottenheim
January 1990
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Defect states of amorphous Si probed by the diffusion and solubility of Cu Article
Appl. Phys. Lett., 1230-1232.A. Polman (Albert), D.C. Jacobson, S. Coffa, J.M. Poate, S. Roorda and W.C. Sinke (Wim)
January 1990 -
A system for high pressure preparation and UHV characterization of surface reactions Article
Meas. Sci. Technol., 1244-1246.P.H.F. Reijnen, U. van Slooten, A.P. de Jongh, J.H.M. Kuijper and A.W. Kleyn
January 1990 -
Oxidation-induced segregation at the Pt0.5Ni0.5(111) surface studied by medium-energy ion scattering Article
Appl. Surf. Sci., 121-129.S. Deckers, F.H.P.M. Habraken, W.F. van der Weg, A.W. Denier van der Gon, J.F. van der Veen and J.W. Geus
January 1990