AMOLF Institutional Repository
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Strain relaxation in Ge/Si(001) studied using X-ray diffraction Book Chapter
J.E. MacDonald, A.A. Williams, R. van Silfhout, J.F. van der Veen, M.S. Finney, A.D. Johnson and C. Norris
January 1990 -
On-line aerosol analysis combining size determination, laser-induced fragmentation and time-of-flight mass spectroscopy In Proceedings
J. Marijnissen, O. Kievit, H. Mori, B. Scarlett, P. Verheijen, P.G. Kistemaker, R.J.J.M. Steenvoorden and T.L. Weeding
January 1990 -
Ionization and dissociation of H2 in intense laser fields at 1.064mm, 532 nm, and 355 nm Article
Phys. Rev. A, 5500-5513.A. Zavriyev, P.H. Bucksbaum, H.G. Muller and D.W. Schumacher
January 1990 -
Softening of the H2+ molecular bond in intense laser fields Article
Phys. Rev. Lett., 1883-1886.P.H. Bucksbaum, A. Zavriyev, H.G. Muller and D.W. Schumacher
January 1990 -
January 1990
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Above-threshold ionisation with a 2-colour laser field Article
J. Phys. B, 2761-2769.H.G. Muller, P.H. Bucksbaum, D.W. Schumacher and A. Zavriyev
January 1990 -
January 1990
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A broad band multilayer coated blazed grating for X-ray wavelengths below 0.6 nm In Proceedings
A.J.F. den Boggende, M.P. Bruijn, J. Verhoeven (Jan), H. Zeijlemaker (Hans), E.J. Puik and H.A. Padmore
January 1990