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AMOLF Institutional Repository

Selected Open Access and other scholarly publications from AMOLF and related researchers.

Photon localization in disorder-induced periodic multilayers Article

J. Phys. I, 1145-1154.

B.A. van Tiggelen and A. Tip

January 1991
Laser single photon ionization mass spectrometry of linear, branched and cyclic hexanes Article

Int. J. Mass Spectrom. Ion Processes, 475-489.

R.J.J.M. Steenvoorden, P.G. Kistemaker, A.E. de Vries, L. Michalak and N.M.M. Nibbering

January 1991
Order-disorder transitions at surfaces Article

Surf. Sci., 1-5.

J.F. van der Veen and J.W.M. Frenken

January 1991
Reduction of secondary defect formation in MeV As ion implanted Si(100) Article

Nucl. Instrum. Methods Phys. Res. B, 614-618.

R. Schreutelkamp, W.X. Lu, J.R. Liefting, V. Raineri, J.S. Custer and F.W. Saris

January 1991
Thermal degradation characteristics of high impact polystyrene/decabromodiphenylether/antimony oxide studied by derivative thermogravimetry and temperature resolved pyrolysis-mass spectrometry: formation of polybrominated dibenzofurans, antimony (oxy)bromides and brominated styrene oligomers Article

J. Anal. Appl. Pyrolysis, 303-319.

R. Luijk, H.A.J. Govers, G.B. Eijkel (Gert) and J.J. Boon

January 1991
Simulation of sub-molecular and supra-molecular fluids Article

Physica A, 54-62.

D. Frenkel

January 1991
Structural relaxation in amorphous silicon and the role of network defects Article

Nucl. Instrum. Methods Phys. Res. B, 344-352.

S. Roorda, J.S. Custer, W.C. Sinke (Wim), J.M. Poate, D.C. Jacobson, A. Polman (Albert) and F. Spaepen

January 1991
Secondary defect reduction by channeling implantation of B and P in <100> silicon Article

Nucl. Instrum. Methods Phys. Res. B, 1056-1060.

V. Raineri, R. Schreutelkamp, F.W. Saris, R.E. Kaim and K.T.F. Janssen

January 1991

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