AMOLF Institutional Repository
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Dislocation formation in silicon implanted at different temperatures Article
Mater. Sci. Eng. B, 173-186.January 1992 -
Neutralization as a probe for ionic structures and the dissociative dynamics of electronically excited states: the nitromethane case Article
J. Phys. Chem., 9288-9293.J.H.M. Beijersbergen, W.J. van der Zande, P.G. Kistemaker, J.H. Los, T. Drewello and N.M.M. Nibbering
January 1992 -
Histology and pyrolysis mass spectrometry of maize somatic embryos from suspension culture Article
Acta Bot. Neerl.January 1992 -
Time-dependent diffusivity of Au in amorphous Pd40Ni40P20 measured by Rutherford-backscattering spectrometry Article
Nucl. Instrum. Methods Phys. Res. B, 445-450.P.A. Duine, J. Sietsma, A. van den Beukel and A.J. Vredenberg
January 1992 -
Efficient population transfer in a three-level ladder system by frequency-swept ultrashort laser pulses Article
Phys. Rev. Lett., 2062-2065.January 1992 -
The European programme on negative ion beam development In Proceedings
R. Hemsworth, H.J. Hopman, C. Jacquot, J. Pamela and A.J.T. Holmes
January 1992 -
Design study of a 1 MV, 4 A, D- test bed in European Community In Proceedings
J. Pamela, R. Hemsworth, H.J. Hopman, C. Jacquot and A.J.T. Holmes
January 1992 -
Vacancy-type and electrical defects in amorphous silicon probed by positrons and electrons In Proceedings
S. Roorda, R.A. Hakvoort, A. van Veen, P.A. Stolk and F.W. Saris
January 1992