AMOLF Institutional Repository
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Resonant point scatterers in multiple scattering of classical waves Article
Phys. Lett. A, 191-194.January 1992 -
The growth of indium on the Si(111) surface studied by X-ray reflectivity and Auger electron spectroscopy Article
Surf. Sci., 330-336.January 1992 -
The influence of small imperfections in inhomogeneous magnetic sector fields on ion trajectories and focussing properties Article
Int. J. Mass Spectrom. Ion Processes, 65-70.January 1992 -
Time-dependent diffusivity of Au in amorphous Pd40Ni40P20 measured by Rutherford-backscattering spectrometry Article
Nucl. Instrum. Methods Phys. Res. B, 445-450.P.A. Duine, J. Sietsma, A. van den Beukel and A.J. Vredenberg
January 1992 -
Picosecond photocarrier lifetimes in ion-irradiated amorphous and crystalline silicon Book Chapter
P.A. Stolk, L. Calcagnile, S. Roorda, H.B. van Linden van den Heuvell and F.W. Saris
January 1992 -
Analytical pyrolysis mass spectrometry: new vistas opened by temperature-resolved in-source PYMS Article
Int. J. Mass Spectrom. Ion Processes, 755-787.January 1992 -
The amorphous side of solid phase epitaxy In Proceedings
January 1992 -
The role of extended defects on transient boron diffusion in ion-implanted silicon Article
Mater. Sci. Eng. B, 307-325.R. Schreutelkamp, J.S. Custer, V. Raineri, W.X. Lu, J.R. Liefting, F.W. Saris, K.T.F. Janssen, P.F.H.M. van der Meulen and R.E. Kaim
January 1992