AMOLF Institutional Repository
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Ion bombardment of thin layers: the effect on the interface roughness and its x-ray reflectivity (invited) Article
Rev. Sci. Instrum., 1415-1419.E.J. Puik, M.J. van der Wiel, H. Zeijlemaker (Hans) and J. Verhoeven (Jan)
January 1992 -
Configurational bias Monte Carlo: a new sampling scheme for flexible chains Article
Mol. Phys., 59-70.January 1992 -
Design and performance of a focused beam line for surface x-ray diffraction Article
Rev. Sci. Instrum., 1083-1086.C. Norris, M.S. Finney, G.F. Clark, G. Baker, P.R. Moore and R. van Silfhout
January 1992 -
Investigation of the extracted H- current in a continuously pulsed-volume negative-ion source Article
Europhys. Lett., 503-508.R.M.A. Heeren (Ron), K.N. Mellon, M. Hopkins, D. Ciric and A.W. Kleyn
January 1992 -
Velocity autocorrelation function in a four-dimensional lattice gas Article
Europhys. Lett., 39-43.January 1992 -
Kinetics of excimer-laser induced CVD of W Article
Appl. Surf. Sci., 117-120.January 1992 -
Shifts in seston characteristics after inundation of a European coastal salt marsh Article
Limnol. Oceanogr., 1559-1564.M.A. Hemminga, V.A. Klap, J. van Soelen, J.W. de Leeuw and J.J. Boon
January 1992 -
Hoe een nieuwe industrie ontstond (deel 3): de geschiedenis van het Nederlands Ultracentrifuge Project Article
Stroom, 19-26.January 1992