AMOLF Institutional Repository
Selected Open Access and other scholarly publications from AMOLF and related researchers.
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Reduction of secondary defects in MeV ion-implanted silicon by means of ion beam defect engineering Article
J. Appl. Phys., 3780-3784.Z.L. Wang, B.-X. Zhang, Q.-t. Zhao, Q. Li, J.R. Liefting, R. Schreutelkamp and F.W. Saris
January 1992 -
January 1992
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March 1992
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June 1992
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June 1992
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June 1992
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Isolation and quantitative pyrolysis-mass spectrometry of dissolved chlorolignosulphonic acids Dissertation
September 1992 -
September 1992