AMOLF Institutional Repository
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The various causes of stabilization In Proceedings
January 1996 -
January 1996
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Net optical gain at 1.53 µm in Er-doped Al2O3 waveguides on silicon Article
Appl. Phys. Lett., 1886-1888.G.N. van den Hoven, R.J.I.M. Koper, A. Polman (Albert), C. van Dam, J.W.M. van Uffelen and M.K. Smit
January 1996 -
Direct imaging of optical interference in erbium-doped Al2O3 waveguides Article
Opt. Lett., 576-578.G.N. van den Hoven, A. Polman (Albert), C. van Dam, J.W.M. van Uffelen and M.K. Smit
January 1996 -
Streak-camera probing of rubidium Rydberg wave packet decay in an electric field Article
Phys. Rev. Lett., 1784-1787.January 1996 -
January 1996
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High resolution end group determination of low molecular weight polymers by matrix-assisted laser desorption ionization on an external ion source Fourier transform ion cyclotron resonance mass spectrometer Article
J. Am. Soc. Mass Spectrom., 449-457.G.J. van Rooij, M.C. Duursma, R.M.A. Heeren (Ron), J.J. Boon and C.G. de Koster
January 1996 -
Dissociation of polyatomic ions at surfaces: the influence of mechanical and electronic energy transfer Article
Phys. Rev. B, 11207-11210.W.R. Koppers, J.H.M. Beijersbergen, K. Tsumori, T.L. Weeding, P.G. Kistemaker and A.W. Kleyn
January 1996