AMOLF Institutional Repository
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Geometrical vs. statistical models for describing phase transition kinetics in thin films Article
Phys. Chem. Chem. Phys., 5516-5522.January 2004 -
Weakly bound dimers of fermionic atoms Article
Phys. Rev. Lett., 93(Article number: 90404), 1-4.January 2004 -
Response to "Comment on 'Coulomb explosion in femtosecond laser ablation of Si(111)'" [Appl. Phys. Lett. 85, 694 (2004)] Article
Appl. Phys. Lett., 85(4)January 2004 -
Ultrafast charge generation in a semiconducting polymer studied with THz emission spectroscopy Article
Phys. Rev. B, 70(Article number: 33202), 1-4.E. Hendry, M. Koeberg, J.M. Schins, L.D.A. Siebbeles (Laurens) and M. Bonn (Mischa)
January 2004 -
Stress map for ion irradiation: depth-resolved dynamic competition between radiation-induced viscoelastic phenomena in SiO2 Article
Appl. Phys. Lett., 389-391.January 2004 -
A modular data and control system to impove sensitivity, selectivity, speed of analysis, ease of use, and transient duration in an external source FTICR-MS Article
Int. J. Mass Spectrom., 243-253.T.H. Mize, I.M. Taban Barbu, M.C. Duursma, M. Seynen (Marco), M. Konijnenburg, A.J.M. Vijftigschild, C.J. van Doornik, G.J. van Rooij and R.M.A. Heeren (Ron)
January 2004 -
Theory of bulk, surface and interface phase transition kinetics in thin films Article
J. Chem. Phys., 1038-1049.January 2004 -
Discrete solution of the electrokinetic equations Article
J. Chem. Phys., 973-986.January 2004