AMOLF Institutional Repository
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Si adhesion interlayer effects in hydrogen passivated Si/W soft X-ray multilayer mirrors Article
Surf. Sci., 1405-1408.M.J.H. Kessels, J. Verhoeven (Jan), F.D. Tichelaar and F. Bijkerk
January 2006 -
Strong modification of the nonlinear optical response of metallic subwavelength hole arrays Article
Phys. Rev. Lett., 97(Article number: 146102), 1-4.J.A.H. van Nieuwstadt, M. Sandtke, R.H. Harmsen, F.B. Segerink, J.C. Prangsma, S. Enoch and L.K. Kuipers (Kobus)
January 2006 -
Microscopical techniques applied to traditional paintings Article
Infocus Mag., 54-65.January 2006 -
Electron capture dissociation as structural probe for noncovalent gas-phase protein assemblies Article
Anal. Chem., 7191-7196.R.B.J. Geels, S.M. van der Vies, A.J.R. Heck (Albert) and R.M.A. Heeren (Ron)
January 2006 -
Photoluminescence quantum efficiency of dense silicon nanocrystal ensembles in SiO2 Article
Phys. Rev. B, 73(Article number: 132302), 1-4.R.J. Walters, J. Kalkman, A. Polman (Albert), H.A. Atwater (Harry) and M.J.A. de Dood (Michiel)
January 2006 -
Why don't biologists use SIMS? : A critical evaluation of imaging MS Article
Appl Surf. Sci., 6827-6835.R.M.A. Heeren (Ron), L.A. McDonnell, E.R. Amstalden van Hove, S.L. Luxembourg (Stefan), A.F.M. Altelaar and S.R. Piersma
January 2006 -
January 2006
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Control of electron localization in molecular dissociation Article
Science, 246-248.M.F. Kling, Ch. Siedschlag, A.J. Verhoef, J.I. Khan, M. Schultze, T. Uphues, Y.F. Ni (Yongfeng), M. Uiberacker, M. Drescher, F. Krausz (Ferenc), et al. M.J.J. Vrakking
January 2006