Direct Observation of Topological Edge States in Silicon Photonic Crystals

Parappurath, Nikhil; Alpeggiani, Filippo; Kuipers, Kobus; Verhagen, Ewold

doi:10.1364/CLEO_AT.2019.JM2B.2

N. Parappurath (Nikhil), F. Alpeggiani (Filippo), L.K. Kuipers (Kobus) and E. Verhagen (Ewold)

2019-05-05

Direct Observation of Topological Edge States in Silicon Photonic Crystals

We directly observe the states of topological photonic crystals at telecom wavelengths. Using the states’ intrinsic radiation, we measure dispersion, loss, pseudospin, and spin-spin scattering. We image spin-selective unidirectional propagation around sharp corners and junctions.

Additional Metadata
Publisher	OPG
Persistent URL	doi.org/10.1364/CLEO_AT.2019.JM2B.2
Organisation	Photonic Forces
Citation APA Style AAA Style APA Style Cell Style Chicago Style Harvard Style IEEE Style MLA Style Nature Style Vancouver Style American-Institute-of-Physics Style Council-of-Science-Editors Style BibTex Format Endnote Format RIS Format CSL Format DOIs only Format	Parappurath, N., Alpeggiani, F., Kuipers, K., & Verhagen, E. (2019). Direct Observation of Topological Edge States in Silicon Photonic Crystals. In CLEO: Applications and Technology, paper JM2B. 2. doi:10.1364/CLEO_AT.2019.JM2B.2

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