Application of low energy ions to modify multilayer systems for omproved x-ray reflectivitiy

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Publisher	Nova science publishers
Editor	S. Chakraborty
Citation APA Style AAA Style APA Style Cell Style Chicago Style Harvard Style IEEE Style MLA Style Nature Style Vancouver Style American-Institute-of-Physics Style Council-of-Science-Editors Style BibTex Format Endnote Format RIS Format CSL Format DOIs only Format	Verhoeven, J. (2002). Application of low energy ions to modify multilayer systems for omproved x-ray reflectivitiy. In S. Chakraborty (Ed.), Ion Beam Analysis of Surfaces and Interfaces of Condensed Matter Systems (pp. 311–356).

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