Imaging of carrier-envelope phase effects in above-threshold ionization with intense few-cycle laser fields
New J. Phys. , Volume 10 - Issue Article number: 25024 p. 1- 17
Sub-femtosecond control of the electron emission in abovethreshold ionization of the rare gases Ar, Xe and Kr in intense few-cycle laser fields is reported with full angular resolution. Experimental data that were obtained with the velocity-map imaging technique are compared to simulations using the strong-field approximation (SFA) and full time-dependent Schrödinger equation (TDSE) calculations. We find a pronounced asymmetry in both the energy and angular distributions of the electron emission that critically depends on the carrier-envelope phase (CEP) of the laser field. The potential use of imaging techniques as a tool for single-shot detection of the CEP is discussed.
|New J. Phys.|
Kling, M. F, Rauschenberger, J, Verhoef, A. J, Hasović, E, Uphues, T, Milosevic, D. B, … Vrakking, M. J. J. (2008). Imaging of carrier-envelope phase effects in above-threshold ionization with intense few-cycle laser fields. New J. Phys., 10(Article number: 25024), 1–17. doi:10.1088/1367-2630/10/2/025024