1970
Gallium implantations in silicon, studied by proton backscattering, X-ray emission and Hall effect
Publication
Publication
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Peter Peregrinus Limited | |
van der Weg, W. F, den Boer, J. A, Saris, F.W, & Onderdelinden, D. (1970). Gallium implantations in silicon, studied by proton backscattering, X-ray emission and Hall effect. In European Conference on ion implantation : Reading september 7th-9th 1970 (pp. 198–202). Peter Peregrinus Limited.
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