Gallium implantations in silicon, studied by proton backscattering, X-ray emission and Hall effect

1970

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Publisher	Peter Peregrinus Limited
Citation APA-ALL APA Style APA-ALL Style AAA Style Cell Style Chicago Style Harvard Style IEEE Style MLA Style Nature Style Vancouver Style American-Institute-of-Physics Style Council-of-Science-Editors Style BibTex Format Endnote Format RIS Format CSL Format DOIs only Format	van der Weg, W. F., den Boer, J. A., Saris, F. W.& Onderdelinden, D. (1970). Gallium implantations in silicon, studied by proton backscattering, X-ray emission and Hall effect. European Conference on Ion Implantation : Reading September 7th-9th 1970, 198–202.

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