Gallium implantations in silicon, studied by proton backscattering, X-ray emission and Hall effect

1970-01-01

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Publisher	Peter Peregrinus Limited
Citation APA Style AAA Style APA Style Cell Style Chicago Style Harvard Style IEEE Style MLA Style Nature Style Vancouver Style American-Institute-of-Physics Style Council-of-Science-Editors Style BibTex Format Endnote Format RIS Format CSL Format DOIs only Format	van der Weg, W. F, den Boer, J. A, Saris, F.W, & Onderdelinden, D. (1970). Gallium implantations in silicon, studied by proton backscattering, X-ray emission and Hall effect. In European Conference on ion implantation : Reading september 7th-9th 1970 (pp. 198–202). Peter Peregrinus Limited.

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