High resolution measurements of energy spectra of protons scattered from silicon crystals in the case of planar channelling

1973

Radiat. Eff. , Volume 17 p. 91- 97

Additional Metadata
Journal	Radiat. Eff.
Citation APA Style AAA Style APA Style Cell Style Chicago Style Harvard Style IEEE Style MLA Style Nature Style Vancouver Style American-Institute-of-Physics Style Council-of-Science-Editors Style BibTex Format Endnote Format RIS Format CSL Format DOIs only Format	van der Weg, W. F., Roosendaal, H. E., & Kool, W. H. (1973). High resolution measurements of energy spectra of protons scattered from silicon crystals in the case of planar channelling. Radiat. Eff., 17, 91–97.

Publication