E. A. Wolicki , J. W. Butler , P. A. Treado

Hoonhout, D, Kerkdijk, C. B. W, Bhattacharya, R. S, Kersten, H. H, Turkenburg, W. C, & Saris, F.W. (1978). Surface layer analysis by MEIS using a solid state detector. In E. A Wolicki, J. W Butler, & P. A Treado (Eds.), Proceedings of the Third International Conference on Ion Beam Analysis : Washington, D.C., June 27-July 1, 1977 (pp. 355–360). North-Holland.