E.A. Wolicki , J.W. Butler , P.A. Treado

Hoonhout, D., Kerkdijk, C. B. W., Bhattacharya, R. S., Kersten, H. H., Turkenburg, W. C., & Saris, F. W. (1978). Surface layer analysis by MEIS using a solid state detector. In E. A. Wolicki, J. W. Butler, & P. A. Treado (Eds.), Proceedings of the Third International Conference on Ion Beam Analysis : Washington, D.C., June 27-July 1, 1977 (pp. 355–360).