Surface layer analysis by MEIS using a solid state detector

1978

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Publisher	North-Holland
Editor	E. A. Wolicki , J. W. Butler , P. A. Treado
Citation APA Style AAA Style APA Style Cell Style Chicago Style Harvard Style IEEE Style MLA Style Nature Style Vancouver Style American-Institute-of-Physics Style Council-of-Science-Editors Style BibTex Format Endnote Format RIS Format CSL Format DOIs only Format	Hoonhout, D, Kerkdijk, C. B. W, Bhattacharya, R. S, Kersten, H. H, Turkenburg, W. C, & Saris, F.W. (1978). Surface layer analysis by MEIS using a solid state detector. In E. A Wolicki, J. W Butler, & P. A Treado (Eds.), Proceedings of the Third International Conference on Ion Beam Analysis : Washington, D.C., June 27-July 1, 1977 (pp. 355–360). North-Holland.

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