Absolute emission cross sections for the calibration of optical detection systems in the 120-250 nm range

1979-01-01

Chem. Phys. Lett. , Volume 65 p. 55- 60

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Journal	Chem. Phys. Lett.
Citation APA Style AAA Style APA Style Cell Style Chicago Style Harvard Style IEEE Style MLA Style Nature Style Vancouver Style American-Institute-of-Physics Style Council-of-Science-Editors Style BibTex Format Endnote Format RIS Format CSL Format DOIs only Format	van Sprang, H.A, Brongersma, H.H, & de Heer, F.J. (1979). Absolute emission cross sections for the calibration of optical detection systems in the 120-250 nm range. Chem. Phys. Lett., 65, 55–60.

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