The well depths of XeF- and XeCI- from differential scattering measurements

1979-01-01

Chem. Phys. Lett. , Volume 65 p. 93- 94

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Journal	Chem. Phys. Lett.
Citation APA Style AAA Style APA Style Cell Style Chicago Style Harvard Style IEEE Style MLA Style Nature Style Vancouver Style American-Institute-of-Physics Style Council-of-Science-Editors Style BibTex Format Endnote Format RIS Format CSL Format DOIs only Format	de Vreugd, C, Wijnaendts van Resandt, R. W, & Los, J. H. (1979). The well depths of XeF- and XeCI- from differential scattering measurements. Chem. Phys. Lett., 65, 93–94.

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