1979-01-01
The well depths of XeF- and XeCI- from differential scattering measurements
Publication
Publication
Chem. Phys. Lett.
,
Volume 65
p. 93-
94
Additional Metadata | |
---|---|
Journal | Chem. Phys. Lett. |
Citation |
de Vreugd, C, Wijnaendts van Resandt, R. W, & Los, J. H. (1979). The well depths of XeF- and XeCI- from differential scattering measurements. Chem. Phys. Lett., 65, 93–94.
|