Additional Metadata
Publisher Academic Press
Editor C. W. White , P. S. Peercy
Citation
Hoonhout, D, & Saris, F.W. (1980). Segregation effects in pulsed laser annealing of ion-implanted silicon. In C. W White & P. S Peercy (Eds.), Laser and Electron Beam Processing of Materials : Papers presented at the Symposium on "Laser and Electron Beam Processing of Materials," held in Cambridge, Mass., November 27-30, 1979 (pp. 137–142). Academic Press.