Academic Press
C.W. White , P.S. Peercy

Hoonhout, D., & Saris, F. W. (1980). Segregation effects in pulsed laser annealing of ion-implanted silicon. In C. W. White & P. S. Peercy (Eds.), Laser and Electron Beam Processing of Materials : Papers presented at the Symposium on "Laser and Electron Beam Processing of Materials," held in Cambridge, Mass., November 27-30, 1979 (pp. 137–142).