Ion beam crystallography of metal-silicon interfaces: Pd-Si(111)

1982

Thin Solid Films , Volume 93 p. 151- 159

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Journal	Thin Solid Films
Citation APA-ALL APA Style APA-ALL Style AAA Style Cell Style Chicago Style Harvard Style IEEE Style MLA Style Nature Style Vancouver Style American-Institute-of-Physics Style Council-of-Science-Editors Style BibTex Format Endnote Format RIS Format CSL Format DOIs only Format	Tromp, R. M., van Loenen, E. J., Iwami, M., Smeenk, R. G.& Saris, F. W. (1982). Ion beam crystallography of metal-silicon interfaces: Pd-Si(111). Thin Solid Films, 93, 151–159.

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