Ion beam crystallography of the Si(111)-(7x7) and (1x1) surfaces

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Publisher	North-Holland
Editor	M. Averous
Citation APA Style AAA Style APA Style Cell Style Chicago Style Harvard Style IEEE Style MLA Style Nature Style Vancouver Style American-Institute-of-Physics Style Council-of-Science-Editors Style BibTex Format Endnote Format RIS Format CSL Format DOIs only Format	Tromp, R. M., van Loenen, E. J., Iwami, M., & Saris, F. W. (1983). Ion beam crystallography of the Si(111)-(7x7) and (1x1) surfaces. In M. Averous (Ed.), Proceedings of the 16th International Conference on the Physics of Semiconductors, 6-10 September 1982, Montpellier, France ; Part II (pp. 779–780).

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