Real-space determination of atomic structure and bond relaxation at the NiSi2-Si(111) interface

1985-01-01

Phys. Rev. Lett. , Volume 54 p. 827- 830

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Journal	Phys. Rev. Lett.
Citation APA Style AAA Style APA Style Cell Style Chicago Style Harvard Style IEEE Style MLA Style Nature Style Vancouver Style American-Institute-of-Physics Style Council-of-Science-Editors Style BibTex Format Endnote Format RIS Format CSL Format DOIs only Format	van Loenen, E. J, Frenken, J. W. M, van der Veen, J. F, & Valeri, S. (1985). Real-space determination of atomic structure and bond relaxation at the NiSi2-Si(111) interface. Phys.Rev.Lett., 54, 827–830.

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