1985
Real-space determination of atomic structure and bond relaxation at the NiSi2-Si(111) interface
Publication
Publication
Phys. Rev. Lett. , Volume 54 p. 827- 830
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Phys. Rev. Lett. | |
van Loenen, E. J, Frenken, J. W. M, van der Veen, J. F, & Valeri, S. (1985). Real-space determination of atomic structure and bond relaxation at the NiSi2-Si(111) interface. Phys.Rev.Lett., 54, 827–830.
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