university website Publications by Year
  • Submit a publication
  • sign in
  • Surf. Sci. /
  • Article
  • Search

J. F. van der Veen and E. J. van Loenen

1986

High-resolution Rutherford backscattering spectrometry or metal-silicon interfaces

Publication

Publication

Surf. Sci. , Volume 168 p. 701- 712

Additional Metadata
Journal Surf. Sci.
Citation
APA Style
  • AAA Style
  • APA Style
  • Cell Style
  • Chicago Style
  • Harvard Style
  • IEEE Style
  • MLA Style
  • Nature Style
  • Vancouver Style
  • American-Institute-of-Physics Style
  • Council-of-Science-Editors Style
  • BibTex Format
  • Endnote Format
  • RIS Format
  • CSL Format
  • DOIs only Format
van der Veen, J. F, & van Loenen, E. J. (1986). High-resolution Rutherford backscattering spectrometry or metal-silicon interfaces. Surf. Sci., 168, 701–712.

university website
  • Address

    • AMOLF
    • Science Park 104
    • 1098 XG Amsterdam
    • The Netherlands
    • library@amolf.nl
artudis website

Workflow

Workflow

Add Content


User Publication Person Organisation Collection
Close