High-resolution Rutherford backscattering spectrometry or metal-silicon interfaces

1986-01-01

Surf. Sci. , Volume 168 p. 701- 712

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Journal	Surf. Sci.
Citation APA Style AAA Style APA Style Cell Style Chicago Style Harvard Style IEEE Style MLA Style Nature Style Vancouver Style American-Institute-of-Physics Style Council-of-Science-Editors Style BibTex Format Endnote Format RIS Format CSL Format DOIs only Format	van der Veen, J. F, & van Loenen, E. J. (1986). High-resolution Rutherford backscattering spectrometry or metal-silicon interfaces. Surf. Sci., 168, 701–712.

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