Time-resolved X-ray absorption spectroscopy on Si during pulsed-laser irradiation

1987

Additional Metadata
Publisher	World Scientific
Editor	O. Engstr
Citation APA Style AAA Style APA Style Cell Style Chicago Style Harvard Style IEEE Style MLA Style Nature Style Vancouver Style American-Institute-of-Physics Style Council-of-Science-Editors Style BibTex Format Endnote Format RIS Format CSL Format DOIs only Format	Murakami, K., van Brug, H., van dere Pol, R., Gerritsen, H. C., Bijkerk, F., & van der Wiel, M. J. (1987). Time-resolved X-ray absorption spectroscopy on Si during pulsed-laser irradiation. In O. Engstr (Ed.), 18th International Conference on the Physics of Semiconductors : Stockholm, Sweden, August 11-15, 1986 (pp. 1065–1068).

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