Summary Abstract: Extended x-ray absorption fine-structure features in the reflectivity of x-ray multilayers

1987

J. Vac. Sci. Technol. A , Volume 5 p. 2028- 2029

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Journal	J. Vac. Sci. Technol. A
Citation APA Style AAA Style APA Style Cell Style Chicago Style Harvard Style IEEE Style MLA Style Nature Style Vancouver Style American-Institute-of-Physics Style Council-of-Science-Editors Style BibTex Format Endnote Format RIS Format CSL Format DOIs only Format	van Brug, H., van der Wiel, M. J., Bruijn, M. P., & Verhoeven, J. (1987). Summary Abstract: Extended x-ray absorption fine-structure features in the reflectivity of x-ray multilayers. J. Vac. Sci. Technol. A, 5, 2028–2029.

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